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  • 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference
  • OSA Technical Digest (Optica Publishing Group, 2019),
  • paper cf_8_3

Characterization of 8 fs Deep-UV Pulses Using XPW Dispersion Scan

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Abstract

The measurement of few-fs-long deep-ultraviolet (DUV) pulses is one of the most demanding tasks for optical pulse characterization as these pulses are very much prone to material dispersion and space-time distortions. Therefore, the arrangements should be very carefully designed not to deteriorate the pulses in the course of the measurement. Furthermore, in this wavelength range the most popular nonlinearities used for the characterization such as second harmonic or sum frequency generation processes become unpractical or even unfeasible due to the very limited phase-matching or the even shorter wavelength of the resulted signal. Consequently, up to now most of short UV pulses were characterized by the FROG technique utilizing a degenerate four-wave mixing process, such as self diffraction [1] or transient grating formation [2]. Nevertheless, this technique suffers from rather bad signal to noise ratio and low sensitivity due to wave front splitting necessary for such method.

© 2019 IEEE

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