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  • 2021 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference
  • OSA Technical Digest (Optica Publishing Group, 2021),
  • paper jsiv_2_2

Deeply Subwavelength Topological Microscopy

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Abstract

We report on far-field imaging of subwavelength objects at resolution exceeding 20 by employing topologically structured light and artificial intelligence.

© 2021 IEEE

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