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Nanoscale Optical Mode Imaging and Spectroscopy of Dielectric Metasurfaces Based on the Bound State in Continuum

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Abstract

We use photoemission electron microscopy for hyperspectral imaging of electromagnetic field localization in broken-symmetry III-V semiconductor metasurfaces with high selectivity to characterize complex resonant mode profiles, determine coherent interaction lengths, and corroborate FDTD simulations.

© 2023 The Author(s)

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