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Terahertz Characterization via an All-Optical, Ultra-Thin-Knife-Edge Technique

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Abstract

An all-optical, terahertz characterization based on a ultra-thin-knife-edge is demonstrated employing an ultraviolet-pulse to project the image of a blade on a ZnTe crystal, where the free carriers excited on a blade-shaped area act as a field-shield.

© 2013 Optical Society of America

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