Abstract
Using a dual-arm Z-scan to increase the signal-to-noise, we measure the dispersion of the electronic third-order nonlinearity of symmetric polymethines and squaraines and find good agreement with the essential-state model including CS2.
© 2013 Optical Society of America
PDF ArticleMore Like This
Trenton R. Ensley, Honghua Hu, Zhong’an Li, Sei-Hum Jang, Alex K-Y. Jen, David J. Hagan, and Eric W. Van Stryland
JW2A.47 CLEO: Applications and Technology (CLEO:A&T) 2013
Joel M. Hales, Jochen Campo, Nikolay Makarov, Yanrong Shi, Stephen Barlow, Seth R. Marder, and Joseph W. Perry
JW4A.50 CLEO: Applications and Technology (CLEO:A&T) 2012
Marten Beels, Manolis D. Tzirakis, Benjamin Breiten, François Diederich, and Ivan Biaggio
FTh4D.1 Frontiers in Optics (FiO) 2013