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Electro-optic and converse piezoelectric coefficients of epitaxial thin films: GaN grown on Si, and (Sr,Ba)Nb2O6 (SBN) grown on Pt coated MgO.

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Abstract

We report the first measurement of the (r13, r33) Pockels electro-optic coefficients in a SBN thin film and in a GaN thin film grown on silicon. The converse-piezoelectric and electro-absorptive coefficients are simultaneously determined.

© 2014 Optical Society of America

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Poster Presentation

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