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Particle vs. Mode Entanglement in Optical Quantum Metrology

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Abstract

We present a constructive proof of the fact that mode entanglement is not necessary for optical quantum enhanced metrology (QEM) but particle entanglement is. We provide a particle entanglement witness that detects all path symmetric states useful for QEM in a Mach-Zender interferometer.

© 2015 Optical Society of America

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