Hot Electron Schottky Detection Based on Internal Photoemission in Silicon Structures

Boris Desiatov; Noa Mazurski; Joseph Shapir; Jacob Khurgin; Uriel Levy

doi:10.1364/CLEO_QELS.2015.FTh3E.4

CLEO: 2015
OSA Technical Digest (online) (Optica Publishing Group, 2015),
paper FTh3E.4
•https://doi.org/10.1364/CLEO_QELS.2015.FTh3E.4

Hot Electron Schottky Detection Based on Internal Photoemission in Silicon Structures

Boris Desiatov, Noa Mazurski, Joseph Shappir, Jacob B. Khurgin, and Uriel Levy

CLEO: QELS_Fundamental Science 2015

San Jose, California United States
10–15 May 2015
ISBN: 978-1-55752-968-8

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Light Harvesting and Electroplasmonics (FTh3E)

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B. Desiatov, N. Mazurski, J. Shapir, J. Khurgin, and U. Levy, "Hot Electron Schottky Detection Based on Internal Photoemission in Silicon Structures," in CLEO: 2015, OSA Technical Digest (online) (Optica Publishing Group, 2015), paper FTh3E.4.

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Abstract

We demonstrate the design, fabrication and characterization of plasmonic enhanced silicon photo-detector for infrared light. Theoretical model, experimental results and comparison between different geometric configurations will be presented and discussed.

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