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Doppler-Shift Emulation Using Highly Time-Refracting TCO Layer

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Abstract

A wavelength shift of 15 nm is obtained for near-infrared (1250 nm) pulses interacting with a temporally engineered Al-doped-ZnO layer. The underlying time-refraction process is driven by an intense, <100 fs pulse at 785 nm.

© 2016 Optical Society of America

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