Abstract
We combine a novel Fourier demodulation analysis with numerical simulations of nearfield microscopy. Thereby, we quantify the experimentally inaccessible, nanoscale electric field distributions from which we infer the fundamental limits of the spatial resolution.
© 2020 The Author(s)
PDF ArticleMore Like This
Angela Pizzuto, Daniel M. Mittleman, and Perniile Klarskov
SM2F.2 CLEO: Science and Innovations (CLEO:S&I) 2020
R. Hillenbrand
FF1_2 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2007
Wenhao Liu and Shu Jia
FW7E.2 Frontiers in Optics (FiO) 2020