On-Chip Interferometric Random Spectrometer (IRS)

Eitan Edrei; Elam Gerstel; Shani Gamzu Letova; Uriel Levy

doi:10.1364/CLEO_AT.2021.JTh3A.44

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 2021),
paper JTh3A.44
•https://doi.org/10.1364/CLEO_AT.2021.JTh3A.44

On-Chip Interferometric Random Spectrometer (IRS)

Eitan Edrei, Elam Gerstel, Shani Gamzu Letova, and Uriel Levy

CLEO: QELS_Fundamental Science 2021

San Jose, California United States
9–14 May 2021
ISBN: 978-1-943580-91-0

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Joint Poster Session III (JTh3A)

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E. Edrei, E. Gerstel, S. G. Letova, and U. Levy, "On-Chip Interferometric Random Spectrometer (IRS)," in Conference on Lasers and Electro-Optics, J. Kang, S. Tomasulo, I. Ilev, D. Müller, N. Litchinitser, S. Polyakov, V. Podolskiy, J. Nunn, C. Dorrer, T. Fortier, Q. Gan, and C. Saraceno, eds., OSA Technical Digest (Optica Publishing Group, 2021), paper JTh3A.44.

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Abstract

We introduce an on-chip device combining a random spectrometer with an interferometric scheme to enable higher spectral resolution measurements by more than one order of magnitude as compared to similar platforms.

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