Author Affiliations

Rusen Yan,^1,* Subrina Rafique,¹ Wei Li,^2,3 Xuelei Liang,³ Debdeep Jena,¹ Lei Liu,¹ Berardi Sensale-Rodriguez,¹ and Huili Grace Xing^1,**

¹Department of Electrical Engineering, University of Notre Dame, Notre Dame, USA

²Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology (NIST), Gaithersburg, USA

³Key Laboratory for the Physics and Chemistry of Nano Devices, Peking University, Beijing, China

^*Corresponding author: ryan1@nd.edu

^** hxing@nd.edu