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Rectangular-shaped sub-wavelength terahertz beam profiling via an all-optical knife-edge technique

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Abstract

An all-optical, sub-wavelength terahertz characterization technique based on an ultra-thin-knife-edge is demonstrated employing ultraviolet-pulse to project the blade image on a ZnTe crystal, where the free carriers excited on a blade-shaped area act as field-shield.

© 2014 Optical Society of America

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