Abstract
A non-invasive, real time, method for measuring the longitudinal emittance of electron bunches can be realized by using electro-optic (EO) detection schemes. Implementation of an EO beam diagnostic within the Colorado State University and Jefferson Laboratory beamlines necessitates investigation into how high average power beams affect various EO crystals. Damage mechanisms from proximity to the e-beam from heavy radiation and beam halo damage can affect the viability of such a procedure. This study seeks to characterize these effects and determine a suitable EO diagnostic procedure for electron bunches in the CSU and J-Lab facilities.
© 2014 Optical Society of America
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