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Conferences > CLEO_SI > 2015 > STh1H > STh1H.6

Visualization of the Internal Structure of Orientation-Patterned III–V Semiconductors

Pawel Karpinski, Xin Chen, Vladlen Shvedov, Cyril Hnatovsky, Arnaud Grisard, Eric Lallier, Barry Luther-Davies, Wieslaw Krolikowski, and Yan Sheng

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Abstract

We investigate nonlinear diffraction in orientation-patterned semiconductors and identify Čerenkov second harmonic generation in a transverse geometry of interaction. Čerenkov second harmonic allows nondestructive 3D visualization of the internal structure of orientation-patterned semiconductor.

© 2015 Optical Society of America

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