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Frequency Comb Metrology with a Near-Infrared Optical Parametric Oscillator

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Abstract

We show the first absolute optical frequency metrology demonstration performed with an OPO. The OPO frequency comb shows ~300-mrad integrated CEO phase noise and ~70-kHz optical linewidth at 1557-nm when fully-stabilized to a radio-frequency reference.

© 2016 Optical Society of America

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