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Conferences > CLEO_SI > 2016 > SM3I > SM3I.4

First Investigation of the Noise and Modulation Properties of the Carrier Envelope Offset Frequency in a Modelocked Semiconductor Laser

N. Jornod, P. Brochard, V.J. Wittwer, S. Schilt, S. Hakobyan, D. Waldburger, S.M. Link, C.G.E. Alfieri, M. Golling, L. Devenoges, J. Morel, U. Keller, and T. Südmeyer

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Abstract

We report the first characterization of the CEO-frequency in a modelocked semiconductor laser, in terms of noise and modulation bandwidth, performed using a novel approach that does not require an octave-spanning spectrum and a self-referencing scheme.

© 2016 Optical Society of America

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