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Dual-Comb Spectroscopy for Solid-State Physics and Extension toward Time-Resolved Measurement

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Abstract

Dual-comb spectroscopy was applied for characterization of complex refractive-index of a Si wafer and transient interferogram by optical excitation in an InGaAs-based saturable absorber. Full-characterization tool with wide dynamic-range in time- and frequency-domain is provided.

© 2016 Optical Society of America

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