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Frequency-Domain Measurement of Spontaneous Emission Lifetime in Rare-Earth-Doped Gain Media

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Abstract

The spontaneous emission lifetime in Al2O3:Tm3+ waveguides is measured to be 568 ± 48 µs, using a frequency-domain method. The method is studied and verified in Er3+-doped silica fiber, yielding a measured lifetime of 9.73 ± 0.08 ms.

© 2017 Optical Society of America

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