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Laser Annealing of Low Temperature Deposited Silicon Waveguides

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Abstract

We report the fabrication of low temperature deposited polysilicon waveguides using a laser annealing process. Micro-Raman and XRD measurements reveal the quasi-single crystal-like quality of the material, which exhibits low optical losses of 5.13 dB/cm.

© 2017 Optical Society of America

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