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THz Near-Field Nanoscopy at 25 Nanometer Spatial Resolution

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Abstract

We combine terahertz time-domain spectroscopy with near-field microscopy to achieve extreme sub-wavelength spatial resolution (<25nanometer) in the far-infrared spectral range. We apply our technology to investigate the carrier concentrations in semiconductor devices and single-layer graphene.

© 2018 The Author(s)

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