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All-fiber reflection-based scattering NSOM with low phase drift for guided-wave imaging on a chip

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An all-fiber phase-resolved reflection-based near-field scanning optical microscope with a phase-drift-rate of 0.06°/s is developed. By raster scanning atomic force microscope probe, we measure the complex near-fields and analyse the standing-wave-spectrograms in silicon nano-waveguides.

© 2019 The Author(s)

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