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Single nanoparticle detection with CMOS-compatible heterodyne interferometry

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Abstract

We introduce a CMOS-compatible waveguide interferometry for single nanoparticle detection using optical dark-field scattering and heterodyne technique. The integrated sensor is capable of detecting single 40-nm-radius nanoparticles with a signal-to-noise ratio of 13 dB.

© 2020 The Author(s)

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More Like This
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