Imaging of Minority Charge Carrier Lifetimes of Semiconductors using Digital Light Processing and Compressed Sensing

Aidas Baltušis; Aidas Baltušis; George Koutsourakis; Sebastian Wood; Stephen J. Sweeney

doi:10.1364/CLEO_AT.2021.JTu3A.11

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 2021),
paper JTu3A.11
•https://doi.org/10.1364/CLEO_AT.2021.JTu3A.11

Imaging of Minority Charge Carrier Lifetimes of Semiconductors using Digital Light Processing and Compressed Sensing

Aidas Baltušis, George Koutsourakis, Sebastian Wood, and Stephen J. Sweeney

CLEO: Science and Innovations 2021

San Jose, California United States
9–14 May 2021
ISBN: 978-1-943580-91-0

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Joint Poster Session I (JTu3A)

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A. Baltušis, G. Koutsourakis, S. Wood, and S. J. Sweeney, "Imaging of Minority Charge Carrier Lifetimes of Semiconductors using Digital Light Processing and Compressed Sensing," in Conference on Lasers and Electro-Optics, J. Kang, S. Tomasulo, I. Ilev, D. Müller, N. Litchinitser, S. Polyakov, V. Podolskiy, J. Nunn, C. Dorrer, T. Fortier, Q. Gan, and C. Saraceno, eds., OSA Technical Digest (Optica Publishing Group, 2021), paper JTu3A.11.

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Abstract

We propose and investigate a novel, rapid method for contactless spatial imaging of minority charge carrier lifetimes based on compressed sensing. The proposed method demonstrates an order of magnitude potential increase in imaging speeds.

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