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Conferences > CLEO_SI > 2021 > STh4J > STh4J.6

Localized Excitation of Silicon Photonic Waveguides for Measurement of Free-Carrier Lifetime and Surface Recombination Velocity

Patrick S. Goley, Edward Preisler, and John D. Cressler

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Abstract

A pulsed 639 nm laser is focused to strongly excite 1-µm scale lengths of silicon photonic waveguide. Extraction of the local free-carrier lifetime and recombination velocity information from time-resolved transmission of a continuous 1535 nm probe laser is presented.

© 2021 The Author(s)

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