Ultrafast High-Sensitivity Characterization of Refractive Index Transients Induced by Plasmas or Kerr Effect Using Cross-Polarized Common-Path Temporal Interferometry

Zan Nie; Kenneth A. Marsh; Noa Nambu; Chen-Kang Huang; Chan Joshi

doi:10.1364/CLEO_SI.2021.STu2A.5

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 2021),
paper STu2A.5
•https://doi.org/10.1364/CLEO_SI.2021.STu2A.5

Ultrafast High-Sensitivity Characterization of Refractive Index Transients Induced by Plasmas or Kerr Effect Using Cross-Polarized Common-Path Temporal Interferometry

Zan Nie, Kenneth A. Marsh, Noa Nambu, Chen-Kang Huang, and Chan Joshi

CLEO: Science and Innovations 2021

San Jose, California United States
9–14 May 2021
ISBN: 978-1-943580-91-0

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Applications of Optical Interferometry (STu2A)

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Z. Nie, K. A. Marsh, N. Nambu, C. Huang, and C. Joshi, "Ultrafast High-Sensitivity Characterization of Refractive Index Transients Induced by Plasmas or Kerr Effect Using Cross-Polarized Common-Path Temporal Interferometry," in Conference on Lasers and Electro-Optics, J. Kang, S. Tomasulo, I. Ilev, D. Müller, N. Litchinitser, S. Polyakov, V. Podolskiy, J. Nunn, C. Dorrer, T. Fortier, Q. Gan, and C. Saraceno, eds., OSA Technical Digest (Optica Publishing Group, 2021), paper STu2A.5.

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Abstract

A cross-polarized common-path temporal interferometer using balanced detection was developed for measuring refractive index transients due to plasmas or Kerr effect with a sensitivity of 0.5 mrad and a temporal resolution of 10 fs.

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