High-stability quantum dot passivated with low temperature atomic layer deposition 3-in-1 full-color light-emitting diodes

Yu-Ming Huang; Yu-Hau Liou; An-Chen Liu; Chien-Chung Lin; Hao-Chung Kuo

doi:10.1364/CLEO_SI.2021.SW2F.3

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 2021),
paper SW2F.3
•https://doi.org/10.1364/CLEO_SI.2021.SW2F.3

High-stability quantum dot passivated with low temperature atomic layer deposition 3-in-1 full-color light-emitting diodes

Yu-Ming Huang, Yu-Hau Liou, An-Chen Liu, Chien-Chung Lin, and Hao-Chung Kuo

CLEO: Science and Innovations 2021

San Jose, California United States
9–14 May 2021
ISBN: 978-1-943580-91-0

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Photonics of Low Dimensional Materials I (SW2F)

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Y. Huang, Y. Liou, A. Liu, C. Lin, and H. Kuo, "High-stability quantum dot passivated with low temperature atomic layer deposition 3-in-1 full-color light-emitting diodes," in Conference on Lasers and Electro-Optics, J. Kang, S. Tomasulo, I. Ilev, D. Müller, N. Litchinitser, S. Polyakov, V. Podolskiy, J. Nunn, C. Dorrer, T. Fortier, Q. Gan, and C. Saraceno, eds., OSA Technical Digest (Optica Publishing Group, 2021), paper SW2F.3.

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Abstract

We report a 3-in-1 mini-light emitting diode and combine ink-jet printing technique to achieve a full color in monolithic chip. Finally, make reliability test by low-temperature ALD technology at 2020 color gamut of red and green QDs during 300 hours reliability test under 50°C /50% RH condition.

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