Enhanced-Precision Displacement Measurements Using Position-Entangled Photon Pairs

Aditya N. Sharma; Aditya N. Sharma; Courtney Krafczyk; Andrew N. Jordan; Paul G. Kwiat

doi:10.1364/CLEO_SI.2022.SW4F.4

Conference on Lasers and Electro-Optics
Technical Digest Series (Optica Publishing Group, 2022),
paper SW4F.4
•https://doi.org/10.1364/CLEO_SI.2022.SW4F.4

Enhanced-Precision Displacement Measurements Using Position-Entangled Photon Pairs

Aditya N. Sharma, Courtney Krafczyk, Andrew N. Jordan, and Paul G. Kwiat

CLEO: Science and Innovations 2022

San Jose, California United States
15–20 May 2022
ISBN: 978-1-957171-05-0

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Quantum Metrology for High Precision Measurement (SW4F)

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A. N. Sharma, C. Krafczyk, A. N. Jordan, and P. G. Kwiat, "Enhanced-Precision Displacement Measurements Using Position-Entangled Photon Pairs," in Conference on Lasers and Electro-Optics, Technical Digest Series (Optica Publishing Group, 2022), paper SW4F.4.

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Abstract

Optical split detection is a common technique for measuring displacement. We experimentally demonstrate split-detection measurements using entangled photons. This scheme may be applicable to precision measurements requiring low light intensity, to avoid disturbing a sample.

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