Observation of the Burstein-Moss Effect in GaAs Wafers via Few-Cycle Transient Dispersion Measurement

Rui Zhou; Hemang Jani; Lingze Duan

doi:10.1364/CLEO_SI.2023.SF2R.2

CLEO 2023
Technical Digest Series (Optica Publishing Group, 2023),
paper SF2R.2
•https://doi.org/10.1364/CLEO_SI.2023.SF2R.2

Observation of the Burstein-Moss Effect in GaAs Wafers via Few-Cycle Transient Dispersion Measurement

Rui Zhou, Hemang Jani, and Lingze Duan

CLEO: Science and Innovations 2023

San Jose, CA United States
7–12 May 2023
ISBN: 978-1-957171-25-8

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Dynamics: Oscillators and Applications (SF2R)

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R. Zhou, H. Jani, and L. Duan, "Observation of the Burstein-Moss Effect in GaAs Wafers via Few-Cycle Transient Dispersion Measurement," in CLEO 2023, Technical Digest Series (Optica Publishing Group, 2023), paper SF2R.2.

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Abstract

We report time-resolved measurements of transient dispersion in GaAs wafers using few-cycle pump-probe reflectometry. Comparisons among samples show good agreement with the Burstein-Moss effect model.

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