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Conferences > CLEO_SI > 2023 > STu4F > STu4F.2

Non-destructive Direct Pericarp Thickness Measurement of Sorghum Kernels with Fiber-based Extended Focus Optical Coherence Microscopy

D. Sen, A. Fernández, D. Crozier, B. Henrich, A. Sokolov, M. Scully, W. Rooney, and A. Verhoef

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Abstract

We apply high-resolution Bessel-beam extended focus optical coherence microscopy for non-destructive morphological phenotyping of sorghum seeds. We obtain accurate thickness measurements with a reduced tendency to overestimate the thickness of thin phenotypes.

© 2023 The Author(s)

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