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Data Efficient X-ray Phase Tomography with Self-calibrated Sandpaper Analyzer

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Abstract

We implement 3D phase tomography on an X-ray computed tomography (CT) beamline by adding a sandpaper analyzer in the Fresnel region. Our algorithm solves for 3D phase directly from the raw intensity measurements, while simultaneously estimating the sandpaper phase. We discuss the use of priors to reduce the number of measurements.

© 2017 Optical Society of America

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