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Experimental Verification of 3D Model-Based Restoration for 3D-SIM with Data Reduction

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Abstract

We validate experimentally our previously developed 3D model-based (MB) approach for 3D structured illumination microscopy (3D-SIM) and show its ability to provide accurate 3D restoration using a reduced number of raw 3D-SIM images.

© 2020 The Author(s)

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