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Conferences > DO > 1992 > TuA > TuA3

Holographic beam samplers for high power laser

J.M. Trudeau, J. Fréchette, M. Côté, P. Langlois, M.P. Bélanger, P. Galarneau, R.E. Vander Haeghe, and S. Barsetti

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Abstract

Smart laser-based material processing systems require complete monitoring of the laser beam characteristics. The development of such monitoring units depends strongly on the beam sampling device employed. Beam samplers compatible with a randomly polarized 1 kW average power Nd:YAG laser has been realized by etching an holographic grating directly onto the surface of a high quality fused silica substrate [1].

© 1992 Optical Society of America

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