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Phase reconstruction by multiple plane detection for holographic microscopy

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Abstract

Inline holographic microscopy is known as a technique for absolute phase retrieval. Any distortion of the needed reference wave, e.g. from the surfaces of a test slide, causes reconstruction errors. We apply a multi plane detection technique, which generates the same information as a hologram but does not use any reference wave. The technique was demonstrated for microscopic resolution in case of amplitude objects [1], [2], This paper focuses on imaging and reconstruction of phase objects. The technique is experimentally applied to a Pleurosigma test chart and a phase test standard. Objects with a phase step of π/3 and lateral structure sizes of 2 μm are well resolved.

© 2007 SPIE

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