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Spatially resolved reflectance used to deduce absorption and reduced scattering coefficients

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Abstract

An experimental set-up is presented for wavelength and spatially resolved reflectance measurements (SRR) via optical fibers and imaging optics. In order to characterize the set-up, we made a set of silicone rubber phantoms with different absorber and scatterer concentrations. The remission profiles gained from the phantoms are the input for a look-up table (LUT) based “inverse Monte-Carlo simulation” to deduce absorption μa and reduced scattering coefficients μs’. As an independent method for determination of μa and μs’ we also made measurements with an ‘integrating sphere spectrometer’ (ISS). Our normalization procedure of the SRR measurements is presented and the validity of this method is discussed.

© 2009 OSA/SPIE

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