Abstract

In this work we have developed a single-pixel optical microscope that provides both reflection and transmission images of the sample under test by attaching a diamond pixel layout DMD to a commercial inverted microscope. Our system performs simultaneous measurements of reflection and transmission modes. Besides, in contrast with a conventional system, in our single-element detection system both images belong, unequivocally, to the same plane of the sample. Furthermore, we have designed an algorithm to modify the shape of the projected patterns that improves the resolution and prevents the artifacts produced by the diamond pixel architecture.

© 2015 SPIE