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Accessing deep optical properties of skin using Diffuse Reflectance Spectroscopy

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Abstract

Diffuse reflectance spectroscopy characterizes composition and structure of tissues by determining their scattering and absorption properties. We have developed in our laboratory a low-cost spatially resolved diffuse reflectance spectroscopy instrument. We present in this study some results showing how to adapt this technology on multi-layered tissues. First of all, a method enabling determination of scattering and absorption properties of multi-layered phantoms is described; the adaptation of the initial methodology to focus on deep layers is especially detailed. Then some preliminary results obtained on a panel of volunteer’s redness faces are presented.

© 2015 SPIE

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