Integrating rigorous coupled wave analysis and Monte Carlo ray tracing for OLED device modeling

An-Chi Wei; Jyh-Rou Sze

doi:10.1364/PV.2015.JTu5A.7

Light, Energy and the Environment 2015
OSA Technical Digest (online) (Optica Publishing Group, 2015),
paper JTu5A.7
•https://doi.org/10.1364/PV.2015.JTu5A.7

Integrating rigorous coupled wave analysis and Monte Carlo ray tracing for OLED device modeling

An-Chi Wei and Jyh-Rou Sze

Optics and Photonics for Energy and the Environment 2015

Suzhou China
2–5 November 2015
ISBN: 978-1-55752-002-9

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A. Wei and J. Sze, "Integrating rigorous coupled wave analysis and Monte Carlo ray tracing for OLED device modeling," in Light, Energy and the Environment 2015, OSA Technical Digest (online) (Optica Publishing Group, 2015), paper JTu5A.7.

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Abstract

Rigorous coupled wave analysis and Monte Carlo ray tracing techniques are combined together for modeling the optical performance of OLED. The simulated and the measured results have shown agreement with each other.

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