Abstract

Erbium shows photoluminescence (PL) around 1.54 µm, when incorporated in a solid host material¹ Ion implantation was used to dope bulk sodalime glass with erbium at a well-defined depth² Two samples were prepared with different narrow Er concentration profiles. Figure 1 shows the Er concentration profiles as measured by Rutherford backscattering spectrometry (RBS). Profile A is Gaussian shaped, with a mean depth of 140 nm, much less than the wavelength of the emitted light, and FWHM of 90 nm. Profile B peaks at the glass surface.

© 1994 IEEE