Abstract

We investigate both experimentally and theoretically the operation of the optoelectronically gated scanning tunneling microscope[1,2]. This apparatus is tested in a model-experiment where rapid electrical transients propagating on a coplanar stripline (CPS) are detected. The electrical transients are generated by irradiating a biased optoelectronic gap with a laser “exitation” pulse. In the optoelectronically gated STM, a second optoelectronic gap is placed in between the STM tip apex and the current detection electronics. The gap is irradiated by a second optical “gate” pulse, which has been time-delayed with respect to the excitation pulse. We measure the correlation current as a function of time delay.

© 1996 IEEE