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  • 2015 European Conference on Lasers and Electro-Optics - European Quantum Electronics Conference
  • (Optica Publishing Group, 2015),
  • paper EA_P_27

Multiparameter quantum estimation in integrated interferometers

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Abstract

Quantum metrology [1,2] represents one of the most advanced examples of measurement technology, aiming at ultra-precise measurements of physical quantities. One example is given by phase estimation in optical interferometry, where an optical phase is measured by sending a light probe into the system and by retrieving an estimate of the parameter with measurements of the probe after the propagation. This technique can find application in different contexts, from gravitational-wave interferometry to the investigation of biological samples. Quantum resources, such as quantum entanglement, are adopted to measure an optical phase with a sensitivity lower than by using only classical resources.

© 2015 IEEE

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