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  • 2021 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference
  • OSA Technical Digest (Optica Publishing Group, 2021),
  • paper jsiv_2_3

Full characterization of partially measured systems with neural networks

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We propose a method based on neural networks to characterize a complex optical system from intensity-only measurements. The characterization involves learning the forward and backward mappings of the system that can be subsequently used to project or image arbitrary patterns.

© 2021 IEEE

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