Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Real-time, Sub-Micron Fluorescence Imaging of Extreme Ultraviolet Aerial Images

Not Accessible

Your library or personal account may give you access

Abstract

A new technique using single crystal phosphors has been used to observe, in real time, soft x-ray images with features as small as 100 nm. This fluorescence imaging scheme takes advantage of the high fluorescence yield, high index of refraction, short absorption depth of extreme ultraviolet (EUV) light (λ~139Å) and excellent optical properties of single crystals activated with rare earth ions.

© 1994 Optical Society of America

PDF Article
More Like This
Extreme Ultraviolet Moiré Interferometry

B. La Fontaine, D. L. White, A. A. MacDowell, Z. Tan, D. M. Tennant, and O. R. Wood
TEO.167 Extreme Ultraviolet Lithography (EUL) 1994

Initial Experiments on Direct Aerial Image Measurements in the Extreme Ultraviolet

C.H. Fields, W.G. Oldham, A. K. Ray-Chaudhuri, K. D. Krenz, and R. H. Stulen
OM124 Extreme Ultraviolet Lithography (EUL) 1996

10x Reduction Imaging at 13.4 nm

D. A. Tichenor, A. K. Ray-Chaudhuri, G. D. Kubiak, S. J. Haney, K. W. Berger, R. P. Nissen, G. A. Wilkerson, R. H. Stulen, P. H. Paul, R. W. Arling, T. E. Jewell, Edita Tejnil, W. C. Sweatt, W. W. Chow, J. E. Bjorkholm, R. R. Freeman, M. D. Himel, A. A. MacDowell, D. M. Tennant, L. A. Fetter, O. R. Wood, W. K. Waskiewicz, D. L. White, and D. L. Windt
EOS.89 Extreme Ultraviolet Lithography (EUL) 1994

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.