Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Reflectance coatings for the vacuum/extreme ultraviolet region

Not Accessible

Your library or personal account may give you access

Abstract

A theoretical examination has been undertaken to evaluate the performance of reflective coatings at normal incidence in the spectral region 40-70nm for applications in lithographic imaging systems. Aluminium based multilayer structures were found to offer the highest theoretical reflectance values in this region but due to the presence of surface oxide layers are of little practical value. Alternative multilayer structures based on silicon are offered as an alternative, were it is suggested that oxide formation may be more easily controlled.

© 1996 Optical Society of America

PDF Article
More Like This
Reflecting Multilayer Coatings for EUV Projection Lithography

James H. Underwood
RMC162 Extreme Ultraviolet Lithography (EUL) 1996

Extreme ultraviolet coatings for the next generation lithography

C. Montcalm, J.C. Davidson, R.F. Grabner, R.M. Hudyma, B.B. Kaufmann, P.A. Kearney, M.A. Schmidt, R. Soufli, E. Spiller, C.C. Walton, and J.A. Folta
ThA1 Optical Interference Coatings (OIC) 2001

Reticle blanks for extreme ultraviolet lithography: ion beam sputter deposition of low defect density Mo/Si multilayers

S.P. Vernon, D.R. Kania, P.A. Kearney, R.A. Levesque, A.V. Hayes, B. Druz, E. Osten, R. Rajan, and H. Hedge
R44 Extreme Ultraviolet Lithography (EUL) 1996

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.