Hard X-ray in-situ full-field microscopy for material science applications

I. Snigireva; K. V. Falch; D. Casari; M. Di Michiel; C. Detlefs; R. Mathiesen; A. Snigirev

doi:10.1364/EUVXRAY.2020.ETu1A.4

OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS)
OSA Technical Digest (Optica Publishing Group, 2020),
paper ETu1A.4
•https://doi.org/10.1364/EUVXRAY.2020.ETu1A.4

Hard X-ray in-situ full-field microscopy for material science applications

I. Snigireva, K. V. Falch, D. Casari, M. Di Michiel, C. Detlefs, R. Mathiesen, and A. Snigirev

Compact EUV & X-ray Light Sources 2020

Washington, DC United States
16–20 November 2020
ISBN: 978-1-943580-73-6

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Compact Sources, Applications, and Enabling Technologies I (ETu1A)

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I. Snigireva, K. V. Falch, D. Casari, M. Di Michiel, C. Detlefs, R. Mathiesen, and A. Snigirev, "Hard X-ray in-situ full-field microscopy for material science applications," in OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS), L. Assoufid, P. Naulleau, M. Couprie, T. Ishikawa, J. Rocca, C. Haefner, G. Sansone, T. Metzger, F. Quéré, M. Ebrahim-Zadeh, A. Helmy, F. Laurell, and G. Leo, eds., OSA Technical Digest (Optica Publishing Group, 2020), paper ETu1A.4.

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Abstract

Hard X-ray transmission microscopy based on refractive optics is applied as a tool in material science to study microstructure in two or three dimensions with spatial resolution of 100nm. A few possible application areas for the microscope are illustrated.

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