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Resistive Switching Behaviors In ZnO Thin Films Prepared By Photochemical Activation At Room Temperature

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Abstract

ZnO thin films based resistive switching layer in the Ag/ZnO/ITO structure was fabricated by photochemical activation at low temperature through sol-gel process. The resistive switching characteristics of as fabricated Ag/ZnO/ITO structure are studied.

© 2014 Optical Society of America

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