Abstract

In the past 15 years, angle-resolved photoelectron spectroscopy (ARPES) has progressed from a fairly low energy and momentum resolution technique useful primarily in performing general surveys to one capable of detailed, high resolution studies of surface and bulk electronic structure.^1-3 The primary reason for this progress is the increasing availability of sophisticated instrumentation. In particular, the various desirable characteristics of synchrotron radiation - high photon flux and brightness, tunable photon energy, and linear polarization - have allowed increasingly higher resolution and thus higher precision experiments to be performed. Future advances in producing vacuum ultraviolet and soft x-ray photons, including undulators and free electron lasers, will enhance even further the capabilities of the technique.

© 1988 Optical Society of America