Apertureless Scanning Raman Microscopy

Yanming Zhao; Brendan McCarthy; Thomas D. Milster; Mark S. Anderson; Dror Sarid

doi:10.1364/FIO.2003.MT25

Frontiers in Optics
OSA Technical Digest (CD) (Optica Publishing Group, 2003),
paper MT25
•https://doi.org/10.1364/FIO.2003.MT25

Apertureless Scanning Raman Microscopy

Yanming Zhao, Brendan McCarthy, Thomas D. Milster, Mark S. Anderson, and Dror Sarid

Frontiers in Optics 2003

Tucson, Arizona United States
5–8 October 2003
ISBN: 1-55752-759-8

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Y. Zhao, B. McCarthy, T. D. Milster, M. S. Anderson, and D. Sarid, "Apertureless Scanning Raman Microscopy," in Frontiers in Optics, OSA Technical Digest (CD) (Optica Publishing Group, 2003), paper MT25.

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Abstract

We have developed a novel experimental configuration for local chemical characterization by combining the analytical power of Raman spectroscopy with the nanometer resolution of the atomic force microscope (AFM). Preliminary results indicate that using the SERS effect yields a large local magnification of the Raman signal.

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