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Reflection second-harmonic microscopy of porous silicon structures

Anton Maidikovski, Jung Yongseok, Sergey Magnitskiy, Nikolay Nagorsky, Alexandr Ejov, Fedor Sychev, and Oleg A. Aktsipetrov

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Abstract

Scanning optical microscopy in reflection is used to quantity estimate effectiveness of second harmonic generation in porous silicon performed at various etching current density. We observe linear dependence of second harmonic signal on silicon porosity.

© 2006 Optical Society of America

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