Abstract
We demonstrate in-situ Raman measurements of individual silicon nanowires (100 nm diameter, 10-20 μm in length) which are trapped using optoelectronic tweezers (OET).
© 2007 Optical Society of America
PDF ArticleMore Like This
Arash Jamshidi, Peter J. Pauzauskie, Aaron T. Ohta, Jiaxing Huang, Steven Neale, Hsan-Yin Hsu, Justin Valley, Peidong Yang, and Ming C. Wu
CThLL5 Conference on Lasers and Electro-Optics (CLEO:S&I) 2008
Aaron T. Ohta, Arash Jamshidi, Peter J. Pauzauskie, Hsan-Yin Hsu, Peidong Yang, and Ming C. Wu
CThGG5 Conference on Lasers and Electro-Optics (CLEO:S&I) 2007
Ming C. Wu
JMB1 Digital Holography and Three-Dimensional Imaging (DH) 2009